provides a survey of stepstones of the development of

.  Pole figure measurement by selected area electron diffraction in the TEM
.  Individual grain orientation measurement by evaluating transmission Kikuchi patterns (TKP)
.  Measurement and mapping of local texture with a Scanning X-Ray Apparatus (SXA).

An introduction to crystal texture and anisotropic materials properties is under preparation.

The textbook on modern X-ray diffraction (in German):
L. Spiess, R. Schwarzer, H. Behnken and G. Teichert: Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker.
Teubner B.G. GmbH Verlag, Wiesbaden 2005   ISBN 3-519-00522-0
includes in Chapter 11: Röntgenographische Texturanalyse, pp.377-434, an introduction to X-ray polefigure measurement and ODF analysis.

An introduction to Backscatter Kikuchi Diffraction (BKD) with the SEM ("Automated EBSD") is found on webbsite " www.ebsd.info ".