1987

Prototype of an XSA with energy-dispersive diffraction

R.A. Schwarzer: Proc.12th ICXOM, Cracow 1989, 205-208

1996

New setup with a digital x-y specimen stage on a Huber goniometer.

R.A. Schwarzer and M. Wehrhahn: Proc. ICOTOM-11 (1996) 176-181

1998

Actual version based on a Philips X'Pert MRD goniometer with open Eulerian cradle.

A.H. Fischer and R.A. Schwarzer: Materials Science Forum 273-275(1998) 255-262
A.H. Fischer, D. Weihrauch and R.A. Schwarzer: ibid. 263-270
A.H. Fischer and R.A. Schwarzer: ibid. 673-678
R.A. Schwarzer and A.H. Fischer: Proc. ICOTOM-12 (1999) 204-210

R.A. Schwarzer: Texture mapping by scanning X-ray diffraction and related methods. pp. 50-65 in: A.K. Singh (ed.): Advanced X-ray Techniques in Research and Industry.
IOS Press, Amsterdam, The Netherlands, 2005    ISBN: 1-58603-537-1

D. Rammlmair, M. Wilke, K. Rickers, R.A. Schwarzer, A. Möller and A. Wittenberg: Chapt. 7.6, pp. 640-687 in: B. Beckhoff, B. Kannegiesser, N. Langhoff, R. Wedell and H. Wolff (eds.): Handbook of Practical X-Ray Fluorescence Analysis.
Springer-Verlag Berlin Heidelberg, 2006    ISBN 3-540-28603-9

Main features are:

+ Acquisition of X-ray pole-figures from selected areas (spatial resolution ~ 0.1 mm)
+ Mapping of crystal texture, lattice strain and element distributions
+ Enables a high spatial resolution 30-50 µm;  strain resolution Da/a >= 10^-4