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Individual grain orientation measurement in the TEM
from Transmission Kikuchi Patterns (TKP)

1. Historical developments

1928

First Kikuchi patterns in transmission electron diffraction; mica specimen:
S. Kikuchi: Jap. J. Physics 5
(1928) 83-96

.....


Numerous papers on Kikuchi patterns in materials science and physics
have been published since then by many groups all over the world.
 

1984

Computer-aided indexing of Kikuchi patterns from cubic, tetragonal, and hexagonal crystals in the determination of grain orientations.
R.A. Schwarzer and H. Weiland: Proc. 8th Europ. Congress Electron Microscopy, Budapest 1984, 341-342
Interactive on-line measurement of individual grain orientations from TKP.
The program interprets band widths and center lines, allows for all crystal symmetries. 

1993

Graphical representation of grain and hillock orientations in annealed Al-1%Si films.
D. Gerth and R.A. Schwarzer: Textures and Microstructures 21 (1993) 177-193
Colour-coded crystal orientation maps (COM) using {hkl}<uvw>, Rodrigues or Euler representation of grain orientations.

1994

On-line interpretat of spot and Kikuchi patterns.
S. Zaefferer and R.A. Schwarzer: Materials Science Forum 157-162(1994) 241-246, 247-250
Interactive grain orientation measurement and on-line analysis of Burgers vectors and glide systems (hcp) using TKP and SAD spot patterns in the TEM.

Automated measurement of single grain orientations in the TEM.

S. Zaefferer and R.A. Schwarzer: Z. Metallkunde 85(1994)585-591
I-CCD video camera, Hough transform and "butterfly mask" for band tracing.

1998

Automated crystal orientation mapping (ACOM) with a computer-controlled TEM by interpreting transmission Kikuchi patterns.
R.A. Schwarzer and J. Sukkau: Materials Science Forum 273-275 (1998) 215-222
Digital CCD camera; Radon transform and peak profile analysis have replaced "butterfly mask".
Off-line construction of crystal orientation maps (COM), pole figures and ODF.


You can find a detailed survey over individual grain orientation measurement with the TEM and 56 references in:
Stefan Zaefferer:
Computer-Aided Crystallographic Analysis in the TEM. Advances in Imaging and Electron Physics 125(2002) 355-415

2. Examples of Crystal Orientation Maps (COM) from individual grain orientation measurement with the TEM

COM of a Ti sheet.

 

Stress-induced grain growth in an Al layer on Si substrate.

    Application of the transmission Kikuchi technique to
    stress-induced grain growth in thin films


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