Logo Texture Analysis

Crystallographic Texture

 

Downloads

Download pdf icon R.A. Schwarzer: The determination of local texture by electron diffraction - A tutorial review.
Textures and Microstructures 20 (1993) 7-27

Download  pdf icon R.A. Schwarzer: Texture Mapping by Scanning X-Ray Diffraction and Related Methods.
pages 50 - 65 in: A.K. Singh (ed.): Advanced X-Ray Techniques in Research and Industry.
IOS Press, Amsterdam 2005, ISBN 1-58603-537-1

Download pdf icon  H.-J. Bunge: Texture Analysis in Materials Science - Mathematical Methods. Butterworths 1982
Paperback reprint: Cuvillier-Verlag Göttingen 1993. ISBN 3-928815-81-4
Digital Edition in 2015 of the 1st English Edition by Butterworth&Co (Publ.) 1982

Download(3.5 MB) pdf icon J. Hansen, J. Pospiech and K. Lücke: Tables for Texture Analysis of Cubic Crystals (1978)

Notice: The digital version of "Part A - Review of the Representation of Orientations and Orientation Distributions" and the program listing have been made available for download by the author Prof. Dr. Jan Pospiech (Cracow) in 2016.
"Part B - The Tables" is not included here.

 

Further Reading

An introduction to Backscatter Kikuchi Diffraction (BKD) and "Automated EBSD" is found on the website
     http://www.ebsd.info
and an introduction to advanced EBSD systems (in German) on
     http://www.ebsd.de.

Further reading on the Orientation Density Function (ODF) is found in:

L. Spiess, R. Schwarzer, H. Behnken and G. Teichert: Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker.
1st edition:Teubner B.G. GmbH Verlag, Wiesbaden 2005. ISBN 3-519-00522-0

L. Spiess, G. Teichert, R. Schwarzer, H. Behnken and Ch. Genzel: Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker.
2nd extended edition:Vieweg+Teubner, Wiesbaden 2009. ISBN 978-3-8351-0166-1

This textbook on modern X-ray diffraction (in German) includes in Chapter 11: Röntgenographische Texturanalyse (XRD Texture Analysis) an introduction to X-ray polefigure measurement and ODF analysis.